Release Notes

1.3.0

Release date: 2026-10-07

New Features:

• Increased the maximum length of Piecewise Linear (PWL) waveforms passed to the solver, allowing waveforms with many more points to be defined. If a waveform exceeds the limit, the simulation now stops with an error rather than running with an incomplete waveform.
• Add the ability for users to define region traps.

Bug Fixes:

• Fixed an error in the contour plot colour bar when the plotted value does not vary across the device.
• Fixed device coordinates being read with the wrong units when an .sdm file is opened directly in the Results Visualiser.

1.2.0

Release date: 2026-09-18

New Features:

• Added a Smooth Line option to Cut Line Plots, using spline interpolation to reduce the jagged appearance of results sampled from coarse or irregular meshes.
• Added a new solver option, Max Built-In Voltage Step, to control the maximum Newton step size used when calculating each mesh node's initial built-in potential.

Bug Fixes:

• Added unit labels to the Material Properties Thermal tab.
• Fixed a broken link to the user manual within the application.

1.1.3

Release date: 2026-09-08

Bug Fixes:

• Fixed an issue where opening a region properties window can crash the application.

1.1.2

Release date: 2026-09-03

Bug Fixes:

• Improved the speed of plotting internal variables against terminal variables.
• Fixed an issue where the intrinsic Fermi level (Ei) was mislocated in the results visualiser.

1.1.1

Release date: 2026-08-27

Bug Fixes:

• Fixed an issue where impact ionisation models were not being written correctly to the .sdm file.

1.1.0

Release date: 2026-08-27

New Features:

• Added support for additional electric field driving force (J·E) in impact ionisation modelling.
• Added a user-configurable option to specify the number of threads used by the MUMPS solver.
• Updated the Slotboom mobility model to use material-specific parameters rather than hard-coded values.
• Added support for user-defined bandgap bowing factors, providing greater flexibility when modelling compound semiconductor materials.
• Added the ability to import Piecewise Linear (PWL) waveforms from a .csv file directly into transient voltage sources.

Bug Fixes:

• Updated visualisers so that non-semiconductor insulating materials are rendered consistently with oxide materials.
• Fixed an issue where log-scale Y-axis labels were displayed incorrectly on plots.

1.0.4

Release date: 2026-08-19

Bug Fixes:

• Fixed an issue that could cause the entire application to crash when data in the results visualiser is corrupted.
• Resolved a problem where the Trap Reader could incorrectly read trap profiles when multiple trap profile definitions were present.
• Added a check to the Results Visualiser to prevent .res files with identical filenames being loading.

1.0.3

Release date: 2026-08-18

New Features:

• Added a Simulation Batch Manager which allows multiple simulations to be queued and run as a batch.
• Enhanced window management throughout the application:
  • Added Send to Back
  • Added Bring to Front

Bug Fixes:

• Fixed issues occurring in simulations involving devices with different reference materials.
• Fixed current density calculations in the results visualiser.
• Removed NodeType array from SDM file processing to improve compatibility and simplify data handling.

1.0.2

Release date: 2026-08-13

New Features:

• Added Open buttons for both device and solution files directly within the Main Window, providing quicker access to project resources.
• The application now updates the Current Working Directory (CWD) when launched from a file explorer context menu, ensuring files are opened relative to the selected location.
• Added a TreeView panel to the left side of the Device Editor, providing easier navigation and faster access to property windows.

Bug Fixes:

• Corrected handling of DC source sweep values to ensure values are written correctly the solution file.
• Fixed an issue where the START command could generate .sdm/.res node mismatches in circuits containing multiple device models.
• Removed the requirement for scaling factors when reading .res files.

1.0.1

Release date: 2026-08-04

New Features:

• Added thread count visibility to MUMPS solver options.
• Added configurable time step limits for manual timestep simulations.
• Added a copy-to-clipboard button to the plot settings panel.

Bug Fixes:

• Fixed structured mesh generation failures caused by triangle meshing errors for GaN HEMT devices.
• Fixed contour and cut line plots resetting selected variables when switching between result files or devices.
• Fixed issue with thermal modelling during transient simulations.

1.0.0

Release date: 2026-07-06

New Features:

• Added ability to plot Min/Max/Average values of internal quantities vs external contact values.
• Added support for plotting capacitance on a contact for steady-state simulation results.
• Added oxide semiconductor interface-specific refinement distance control for structured meshes.
• Added an option to display doping windows with transparent rendering.
• Improved contour plotting performance.
• Enhanced plot value labelling.

Bug Fixes:

• Fixed an issue in recombination term calculations when using wide-bandgap materials such as GaN.
• Fixed mesh generation issues related to quadrilateral splitting and mesh smoothing/balancing controls.
• Improved grid and origin line rendering consistency across all zoom levels.

0.1.49

Release date: 2026-06-23

Bug Fixes:

• Fixed .sdm file reader to correctly read Okuto-Crowell impact ionisation model parameters.
• Added an error message when users to tries to load an .sdm file without a mesh into the visualiser.
• Resolved an issue where the interactive readout label on cut line plots would become hidden.

0.1.48

Release date: 2026-06-21

New Features:

• Added plotting of displacement current in transient simulations.

Bug Fixes:

• Fixed Y‑axis label rendering, updated scatter plot colours.
• Fixed Aquarius not closing properly and prevented multiple app instances from launching simultaneously.
• Fixed issues and improved performance in the Simulation Status window.
• Fixed validation issue when clicking off SRH material properties.
• Corrected internal current density calculation.
• Fixed mesh construction grid grading issue.
• Fixed gridlines disappearing at high zoom levels in Device Editor.
• Fixed Resolved scaling issues in displacement terminal output value.
• Fixed compile errors by enforcing strict compiler flags.

0.1.47

Release date: 2026-06-11

Bug Fixes:

• Fixed issue with missing dependencies.

0.1.46

Release date: 2026-06-05

New Features:

• Interactive plot readout functionality introduced.
• Solver Options view now includes a reset button.
• Ability to hide y-axis labels for different variables on the same plot.
• Added the ability to edit material properties for composite materials.
• Added icons for .res, .sdm, and .sol files.

Bug Fixes:

• Added safeguard to prevent constant generation being applied to nodes on a contact.
• Fixed contour plot incorrectly showing electric field inside unmeshed holes.
• Fixed issue where connections were deleted on device contacts when loading a new .sdm file.
• Updated and corrected variable naming for Electron/Hole Temperature.

0.1.45

Release date: 2026-05-20

Bug Fixes:

• Resolved an issue with update-checking logic that resulted in false-positive notifications for higher version releases.

0.1.44

Release date: 2026-05-20

New Features:

• Added support for saving mesh generation settings to .sdm files.
• User Interface Improvements
• Added user-defined time stepping to user interface.
• Enabled editable device names in the circuit editor.
• Added Help Desk link in the Help menu.
• Added Silicon Nitride (SiN) to the material library.
• Implemented Chynoweth parameter interpolation for ternary materials.

Bug Fixes:

• Fixed contact updates not applying correctly in device properties window.
• Fixed IV trace connection validation issues.
• Resolved issue where old .res data was plotted on simulation re-run.
• Fixed Device Editor freezing on saving .sdm file with large node counts.
• Fixed mesh window minimum element size not persisting after reload.
• Fixed CSV trap profile table reading issue.
• Fixed updater launching Aquarius with admin privileges unexpectedly.
• Fixed IV Curve Tracer issues when using steady state values on other terminals.
• Fixed import validation error for user-defined profiles (two-value issue).
• Fixed composition values not resetting when switching from ternary materials.

0.1.43

Release date: 2026-04-28

New Features:

• Added units to Lombardi AC and SR terms in material parameters.
• Updated default value for Maximum Update Increases from 3 to 10.
• Improved device contact handling by sorting contacts alphabetically when writing .sol files.

Bug Fixes:

• Fixed Circuit Editor crash when a transient voltage source uses high‑frequency rectangular pulses (> ~210 kHz).
• Fixed incorrect variable binding in Newton Loop Time Step parameter text boxes.
• Resolved issues with external thermal resistor handling.
• Fixed initialisation bug in transient voltage source setup.
• Removed redundant error messages related to DC Source value definitions.
• Corrected oxide boundary display in contour plots.

0.1.42

Release date: 2026-04-13

New Features:

• Update material library to include InP, Gap and InAs.
• Added a new decoupled electro-thermal algorithm to allow for more accurate thermal simulations and solving of heat equation.

Bug Fixes:

• Fixed mesh generator to enforce edge constraints when using the structured mesh generator.

0.1.41

Release date: 2026-04-02

New Features:

• Added preview graph of trap profile to the GUI properties window.
• Added IV curve tracer support for restart simulations.
• Added additional file validity checks in the Results Visualiser.

Bug Fixes:

• Miscellaneous fixes related to restart‑command testing.
• Corrected errors in the SRH recombination routine.
• Fixed get_nc and get_nv subroutines for GaAs and AlGaAs materials.
• Fixed issue with source numbering being incorrect.
• Fixed a terminal issue where that was occasionally causing the application to crash.
• Fixed that maximum height for point‑coordinates data grid in the region properties window.

0.1.40

Release date: 2026-03-18

Bug Fixes:

• Resolved an issue with transient simulation commands not being written to the solution file correctly.
• Fixed issue with visualisation of electron and hole currents in external plots.

0.1.39

Release date: 2026-03-13

Bug Fixes:

• Resolved an issue causing numerical inaccuracies in the Lombardi interface mobility routine.

0.1.38

Release date: 2026-03-06

New Features:

• Added the Lombardi mobility model with acoustic and surface roughness terms.

0.1.37

Release date: 2026-02-26

New Features:

• Users can now enable negative fixed charges on interface traps.
• Default material parameters for Gallium Nitride (GaN) and Aluminium Nitride (AlN) have been updated to reflect more accurate, industry-standard values.
• Refined the Gaussian trap profile code to utilise Peak Density instead of Total Density for improved calculation precision.
• Implemented support for interface trap recombination.

Bug Fixes:

• Resolved an issue where discrete donor traps were failing to function correctly.
• Fixed a rendering bug where very small values on the Y-axis were incorrectly rounded and displayed as 0.000.
• Fixed a UI glitch in plot settings where the legend alignment text was being truncated.

0.1.36

Release date: 2026-02-05

New Features:

• Added support for new interface trap profile types, including:
  • Top Hat (Uniform)
  • Exponential
  • Discrete
  • Gaussian
  • User‑defined
• Added Fermi–Dirac occupation probability for interface traps.

Bug Fixes:

• Resolved an issue where interface traps were being duplicated in the .sdm file.
• Corrected calculation errors in mole‑fraction‑dependent material properties.
• Fixed a mesh generation bug that was incorrectly removing mesh nodes.

0.1.35

Release date: 2026-01-15

New Features:

• Added option to toggle square axis in contour plots.
• Enabled editing of a Source's name in the circuit editor.
• Post-processor now has editable legend labels.
• Added an Incomplete Ionisation model to solver physics.
• Added mesh type tag (STRUCTURED / UNSTRUCTURED) to .sdm file headers.
• Updated main window tree view to display all directories and subdirectories.
• Added composition‑dependent materials to the UI and AlGaN model.

Bug Fixes:

• DC Source sweeps now allow decreasing steps, including negative ranges.
• Corrected issues in the Contact Properties GUI.
• Node doping now updates correctly when region doping changes.

0.1.34

Release date: 2025-12-16

New Features:

• Added acceptor and donor like interface traps.
• Serval improvements to the post processor, results files are automatically selected when loaded, X and Y contact are preserved when plotting the same device.
• User defined doping profiles can now have a erfc rotation.

Bug Fixes:

• Label name fixed in contact properties.
• Complementary error function for doping profiles.

0.1.33

Release date: 2025-11-20

New Features:

• Introduced the ability to specify fixed charge density along a region edge.

0.1.32

Release date: 2025-11-18

New Features:

• Added the ability to specify log scaling for contour plots.
• Product version numbers now get written to all files.

Bug Fixes:

• Label name fixed in unstructured mesh options.

0.1.31

Release date: 2025-10-17

New Features:

• Introduced a new unstructured mesh generation algorithm, allowing users to define meshes without predefining gridlines.
• Added AlGaN to the material library.
• Added support for graded composition regions, enabling spatially varying material compositions.

0.1.30

Release date: 2025-10-07

Bug Fixes:

• Updating default physical models.

0.1.29

Bug Fixes:

• Fixed issue with numerical precision rounding error when writing value sweeps in DC Voltage/Current sources.

0.1.28

Bug Fixes:

• Fixed issue with writing multiple value sweeps in DC Voltage/Current sources.

0.1.27

Bug Fixes:

• Fixed issue with device temperature inverse effect on gate threshold voltage.

0.1.26

New Features:

• Results Visualiser now allows users to specify custom plot titles and axis labels.
• Models updated to include support for the Okuto–Crowell impact ionisation model.
• Added legends to External and Transient plot types.
• SRH window parameters now use Top and Bottom instead of Top and Depth for clearer configuration.

Bug Fixes:

• Fixed issue with non-uniform doping being applied to invalid nodes.

0.1.25

New Features:

• In the Results Visualizer Case numbers now display time in seconds for transient simulations.

Bug Fixes:

• PWL preview graph now updates correctly when values change.
• Fixed crash when opening the Visualiser from the Device Editor.
• Labels display correctly in the PWL waveform properties window.
• Triangular waveform preview now matches simulator output.
• .res files now correctly write values with 3-digit exponents.
• Fixed DC current source pins orientation.
• Updated .res file reader to correctly parse 3-digit exponents.

0.1.24

New Features:

• Non-linear inductor added.
• Help Button added to the Menu Bar in the Main Window with link to user manual and updates check.
• SWITCH component added.

Bug Fixes:

• Transient Voltage and current source bugs fixed.
• Y-axis Labels improved in visualiser plots.
• Capacitance bug fixed for capacitor component.

0.1.23

New Features:

• Added support for transient waveforms: sine, triangle, and rectangle.
• Introduced a two-coil transformer component.

Bug Fixes:

• Resolved an issue with writing numerical values to .res files when using quadruple precision.
• Fixed a bug where Zener diode properties were not saved correctly.

0.1.22

New Features:

• Added DC Current Source to the circuit editor.
• Implemented RESTART functionality to resume simulations from a previous simulation.
• Solver now outputs numerical values in scientific notation for improved readability and precision.

Bug Fixes:

• Fixed a crash that occurred when plotting contour or line cut data.

0.1.21

New Features:

• The UI now displays the voltage at each source when a case is selected in the results visualizer.
• The solution file now retains the numerical precision setting from the solver options.
• Double-clicking on a region now opens the Region Properties window.
• Doping at all nodes is automatically updated when doping window properties are modified, without requiring re-meshing.
• Improved file readers to prevent application crashes when loading corrupted files.

Bug Fixes:

• Resolved an issue with visualizing component values (resistance, capacitance, etc.).
• Fixed a bug related to reading IV trace contact names.

0.1.20

New Features:

• Added ability to specify a constant generation rate for each semiconductor regions in the device model.
• Start from initial condition now working for Steady-State simulations.
• Mesh generator has the option to automatically refine based on a distance from the oxide interface.

0.1.19

New Features:

• Added ability to refine the mesh elements based open a nodes distance from the metallurgical junction.
• Added additional compatibility checks, when using the start from initial condition command.

Bug Fixes:

• Fixed issue with net names not saving correctly.
• Fixed contour plot, so that new colour bar does not appear when a new plot is created.
• Fixed error in boundary conditions for hetero-junctions.
• Fixed solver output formatting for DC Simulations with Bias Points > 9999.

0.1.18

New Features:

• Enabling users to manually set the axis limits (X Min, X Max, Y Min, Y Max) on X/Y plots by typing values into a popup dialog box.
• Added the functionality to apply the user defined profiles to mesh nodes.

0.1.17

New Features:

• Height of drop box for plot variables selection extended to show more values.
• Zener diode component added.
• Work function automatically updates when specific contact materials are selected.
• Added the ability to move the location of the legend in plots.

Bug Fixes:

• Updated the mesh grid line intersection algorithm to enable graded spacing lines.
• Fixed axis labels bug on external plots.
• Fixed name and value label visibility for all circuit components.
• Fixed bug with adding new license keys when the old key expires.

0.1.16

Bug Fixes:

• Fixing bug when reading in long string of bias points.

0.1.15

New Features:

• Add button for panning, zoom, etc to results visualiser

0.1.14

New Features:

• Plot variable no longer resets when plotting Energy Band Diagram
• The solver output window is now re-sizeable

0.1.13

New Features:

• Users can now use transient source (both voltage and current) in simulations.

Bug Fixes:

• The maximum number of bias points has been increased to 20,000

0.1.12

New Features:

• Users can now use Add To Plot button in Cut Line Plot
• Users can now plot multiple results files within the results Visualiser

Bug Fixes:

• Case File overflow issue partially fixed
• Single values can now be used in voltage sources without errors

0.1.11

New Features:

• 8byte (double precision) and 16byte (quadruple precision) solver variants now available.
• The default case file output type changed to binary to reduce file size.

0.1.10

New Features:

• Improvements to mesh status user interface.

Bug Fixes:

• Fixed bug related to mesh properties dialog window.

0.1.9

New Features:

• Added import of voltage source bias points using .csv file.
• Added a button to order bias points.
• Added code to allow users to plot transient result files.

Bug Fixes:

• Issues with specifying bias range of values has been fixed.

0.1.8

New Features:

• Grid line visibility can be turned ON/OFF.

Bug Fixes:

• Issues with specifying negative bias points has been fixed.

0.1.7

Bug Fixes:

• Issues with defining 'upwards' doping windows has been fixed.

0.1.6

Bug Fixes:

• Issues with properties windows being open blocking other windows within the GUI has been fixed.

0.1.5

New Features:

• Shockley-Read-Hall specifiable windows are now available.
• SDM files can now be opened in the results visualizer. They can be opened directly from the device editor, from the main window, or from inside a visualizer window.
• A button has been added to allow users to draw a zoom-area rectangle in the device editor.
• Users can now import and export material properties, as well as the full material library.
• The curve tracer has now been added to the circuit editor.

Bug Fixes:

• Issues with log scaling for line plots have been fixed.
• Default material properties have been updated.
• The issue preventing users from interacting with other parts of the app while a simulation is running has been fixed.

0.1.4

New Features:

• Diode component added to Circuit Simulator.
• Added the ability to use the esc key to cancel region, window and contact definitions in the Device Editor.
• Added button to Device Editor tool bar to allow the user to pan across the device using the cursor and left mouse button.

Bug Fixes:

• Added a check to see if Aquarius is running and prompting the user to shutdown the app before uninstalling.
• Fixed bug which was making regions 'unclick-able'.
• Fixing net name definition bugs

0.1.3

New Features:

• Plot variables are now listed alphabetically by name.
• User has the ability to export simulation log files.

Bug Fixes:

• Fixing plot variable units.

0.1.2

• Automatic fit content to scale when loading a sdm file.
• Zoom In, Out, Fit to content buttons added for Device Editor.
• View Mesh button now is able to display the .sdm file mesh when a user loads an sdm file.
• Minor bugs fixes for post processor.

0.1.1

• First release.